Admittance    Related Topics

The Admittance submenu contains the functions to calculate converted admittances from the measured S-parameters.

Converted impedances and Z-parameters


Y <– S11, Y <– S12, Y <– S21, Y <– S22

Select the 2-port converted admittance parameters. The parameters describe the admittances of a 2-port DUT, obtained in forward and reverse transmission and reflection measurements:  

The analyzer also provides converted admittances for more drive ports or balanced port configurations; see More Admittances.

Use the More Y-Parameters dialog to measure Y-parameters including the transfer parameters. Use the Inverted Smith chart to obtain an alternative, graphical representation of the converted admittances in a reflection measurement.

Remote control:

CALCulate<Ch>:PARameter:MEASure "<Trace_Name>", "Y-S11" | "Y-S12" | "Y-S21" | "Y-S22"
[SENSe<Chn>:]FUNCtion[:ON] "...:POWer:Y<11 | 12 | 21 | 22>"
 

Create new trace and select name and measurement parameter:
CALCulate<Ch>:PARameter:SDEFine "<Trace_Name>", "Y-S11"
| "Y-S12" | "Y-S21" | "Y-S22"


More Admittances

Opens a dialog to select converted admittances for more ports or balanced port measurements.

The notation for admittance parameters and the functionality of the More Admittances dialog is analogous to the definition of S-parameters.

Single-ended and mixed mode parameters

The relation between the generalized (multiport and mixed mode) admittance parameters and the S-parameters is analogous to the 2-port case and follows from the relations for impedance parameters.

Remote control:

CALCulate<Ch>:PARameter:MEASure "<Trace_Name>", "Y-S11" | "Y-S12" ...

Create new trace and select name and measurement parameter:
CALCulate<Ch>:PARameter:SDEFine "<Trace_Name>", "Y-S11" | "Y-S22" | ...